Reliability Analysis and Plans for Successive Testing: Start-up Demonstration Tests and Applications

Reliability Analysis and Plans for Successive Testing: Start-up Demonstration Tests and Applications discusses all past and recent developments on start-up demonstration tests in the context of current numerical and illustrative examples to clarify available methods for distribution theorists and applied mathematicians dealing with control problems. Throughout the book, the authors focus on the panorama of open problems and issues of further interest. As contemporary manufacturers face tremendous commercial pressures to assemble works of high reliability, defined as 'the probability of the product performing its role under the stated conditions and over a specified period of time', this book helps address testing issues. Unites the tools and methodologies of applied statistics and stochastic modeling to aid the determination of device reliability for better performing consumer goodsClearly articulates how successive testing methods can be used in practiceComments not only on distribution sequences closed, but also on open problems and issues of further interest for researchers INDICE: 1. Binary and multistate models 2. Waiting time distributions 3. Runs, scans and patterns 4. Sooner waiting time problems 5. Optimal design 6. Markov chain embedding technique 7. Quality testing 8. Product quality evaluation 9. Likelihood inference and EM algorithm 10. Bayesian inference

• ISBN: 978-0-12-804288-5
• Editorial: Academic Press
• Encuadernacion: Cartoné
• Páginas: 312
• Fecha Publicación: 01/03/2021
• Nº Volúmenes: 1
• Idioma: Inglés