Micro structural characterization is usually achieved by allowing some form of probe to interact with a carefully prepared specimen. The most commonly usedprobes are visible light, X-ray radiation, a high-energy electron beam, or a sharp, flexible needle. These four types of probe form the basis for optical microscopy, X-ray diffraction, electron microscopy, and scanning probe microscopy. "Micro structural Characterization of Materials, 2nd Edition" is an introduction to the expertise involved in assessing the micro structure of engineering materials and to the experimental methods used for this purpose. Similar tothe first edition, this 2nd edition explores the methodology of materials characterization under the three headings of crystal structure, micro structural morphology, and microanalysis.The principal methods of characterization, including diffraction analysis, optical microscopy, electron microscopy, and chemical micro analytical techniques are treated both qualitatively and quantitatively. An additional chapter has been added to the new edition to cover surface probe microscopy, and there are new sections on digital image recording and analysis, orientation imaging microscopy, focused ion-beam instruments, atom-probe microscopy, and 3-D image reconstruction. As well as being fully updated, this second edition also includes revised and expanded examples and exercises, with a solutions manual. "Micro structural Characterization of Materials, 2nd Edition" will appeal to senior undergraduate and graduate students of material science, materials engineering, and materials chemistry, as well as to qualified engineers and more advanced researchers, who will find the book a useful and comprehensive general reference source.
- ISBN: 978-0-470-02784-4
- Editorial: Blackwell
- Encuadernacion: Cartoné
- Páginas: 550
- Fecha Publicación: 01/03/2008
- Nº Volúmenes: 1
- Idioma: Inglés