In-situ electron microscopy: applications in physics, chemistry and materials science

Adopting a didactical approach from fundamentals to actual experiments and applications, this handbook and ready reference covers modern focused ion beam workstations, scanning electron microscopes and transmission electron microscopes, while also showing how to combine them for real-time observation.The text begins with introductory material and the basics, before going on to cover thetechniques needed to determine growth processes, melting, reactions, and doping as well as mechanical, magnetic, optical and electronic properties. A finalsection is devoted to soft matter. INDICE: I. BasicsScanning Electron Microscopy (SEM)Focused Ion Beam Microscopy (FIB)Transmission Electron Microscopy (including HRTEM and STEM)Camera Systems for Dynamic TEM ExperimentsII. ThermodynamicsGrowth ProcessesMelting andPre-meltingChemical Reactions and OxidationInterface KinetcsFormation of Silicides from a-Si and metal layersFormation of Surface Patterns observed by Reflection Electron MicroscopyIII. Mechanical PropertiesThe FIB PlatformMechanicalTests in the SEMStrain Mapping by Image Correlation (SEM to HRTEM)DislocationMechanismsNew Developments: In-situ Nanoindentation, AFM, and STM Experimentsin the TEMIV. Magnetic PropertiesLorentz-MicroscopyDynamic Observations of Domains, Vortices and of Ultrafast Phenomena by TEM and PEEMV. Optical PropertiesCathodoluminiscence in SEM and TEMOptical Properties of NanotubesVI. Electronic PropertiesEBIC (SEM) and Potential ContrastElectromigration (SEM, TEM)VII. Ferroelectric PropertiesFerroelectric DomainsVIII. Soft MatterExperiments using Wet-cells (SEM, ESEM, biological samples and materials)Structure Determination of Soft Matter using In-situ Techniques

• ISBN: 978-3-527-31973-2
• Editorial: Wiley-VCH
• Encuadernacion: Cartoné
• Páginas: 402
• Fecha Publicación: 25/04/2012
• Nº Volúmenes: 1
• Idioma: Inglés