Microwave scattering and emission models for users

Microwave scattering and emission models for users

Fung, Adrian K.
Chen, Kun-Shan

130,60 €(IVA inc.)

Today, microwave remote sensing has evolved into a valuable and economical tool for a variety of applications. It is used in a wide range of areas, from geological sensing, geographical mapping, and weather monitoring, to GPS positioning, aircraft traffic, and mapping of oil pollution over the sea surface. This unique resource provides microwave remote sensing professionals with practical scattering and emission data models that represent the interaction between electromagnetic waves and a scene on the Earth surface in the microwave region. The book helps engineers understand and apply these models to their specificwork in the field. CD-ROM Included! Contains Mathematica code for all the scattering and emission models presented the book, so practitioners can easily use the models for their own applications. INDICE: Introduction to Microwave Scattering and Emission Models for Users. The Small Perturbation Surface Backscattering Model. The Simplified IntegralEquation Surface Backscattering Model. The IEM-B Surface Backscattering Model. Backscattering from Multi-Scale Surfaces. Bistatic Properties of the IEM-B Surface Scattering Model. The Standard Moment Method. Model for Scattering froma Low Dielectric Layer of Rayleigh Scatterers with Irregular Layer Boundaries. Emission Models for Rough Surfaces and a Rayleigh Layer with Irregular LayerBoundaries.

  • ISBN: 978-1-60807-037-4
  • Editorial: Artech House
  • Encuadernacion: Cartoné
  • Páginas: 315
  • Fecha Publicación: 01/01/2010
  • Nº Volúmenes: 1
  • Idioma: Desconocido