Scanning Electron Microscopy and X-ray Microanalysis
Goldstein, J.
Newbury, D.E.
Joy, D.C.
Lyman, C.E.
Echlin, P.
Lifshin, E.
Sawyer, L.
Michael, J.R.
An ideal text for students as well as practitioners, this is a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The text has been used in educating over 3,000 students at the Lehigh SEM short course as well as thousands of undergraduate and graduate students at universities across the globe. This highly acclaimed text emphasizes the hands-on aspects of imaging and analysis for a broad audience of students and practitioners whose backgrounds span a wide range of science and technology. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. A database of useful parameters for SEM and X-ray micro-analysis calculations and enhancements to the text chapters are available on an accompanying CD.
- ISBN: 978-0-306-47292-3
- Editorial: SPRINGER VERLAG WIEN.
- Encuadernacion: Rústica
- Páginas: 690
- Fecha Publicación: 01/05/2003
- Nº Volúmenes: 1
- Idioma: