Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Contributions from leading authorities Informs and updates on all the latest developments in the field INDICE: Octree Grid Topology Preserving Geometric Deformable ModelYing Bai, Xiao Han and Jerry L. PrinceSecond Order Variational Models for Image Texture AnalysisMaïtine BergouniouxElectron Microscopy of Pharmaceutical SystemsVictoria Klang and Nadejda B. Matsko
- ISBN: 978-0-12-800091-5
- Editorial: Academic Press
- Encuadernacion: Cartoné
- Páginas: 240
- Fecha Publicación: 15/03/2014
- Nº Volúmenes: 1
- Idioma: Inglés