Advances in Imaging & Electron Physics merges two long-running serials-Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Contributions from leading authorities Informs and updates on all the latest developments in the field INDICE: Gaussian Beam Propagation in Inhomogeneous Nonlinear Media. Description in Ordinary Differential Equations by Complex Geometrical OpticsPawel Berczynski and Slawomir MarczynskiSingle-Particle Cryo-Electron Microscopy: Progress, Challenges, and Perspectives for Further Improvement David Agard, Yifan Cheng, Robert M. Glaeser and Sriram SubramaniamMorphological Amoebas and PDEsMartin Welk and Michael Breu
- ISBN: 978-0-12-800144-8
- Editorial: Academic Press
- Encuadernacion: Cartoné
- Páginas: 234
- Fecha Publicación: 01/08/2014
- Nº Volúmenes: 1
- Idioma: Inglés