Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Contributions from leading authorities Informs and updates on all the latest developments in the field INDICE: Pattern Generators for Reflective Electron-Beam LithographyAllen M. CarrollRecent Developments in Time-of-Flight Mass SpectrometryFrank Gunzera and Jürgen Grotemeyerb
- ISBN: 978-0-12-802254-2
- Editorial: Academic Press
- Encuadernacion: Cartoné
- Páginas: 232
- Fecha Publicación: 01/05/2015
- Nº Volúmenes: 1
- Idioma: Inglés