Advances in Imaging and Electron Physics merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Contains contributions from leading authorities on the subject matterInforms and updates on all the latest developments in the field of imaging and electron physicsProvides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electron, and ion emission with a valuable resourceFeatures extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing INDICE: Analytical Methods for the Calculation and Simulation of New Schemes of Static and Time-of-Flight Mass SpectrometersIgor Spivak-LavrovThe eigen-emittance conceptLeanne Delma Duffy
- ISBN: 978-0-12-804815-3
- Editorial: Academic Press
- Encuadernacion: Cartoné
- Páginas: 242
- Fecha Publicación: 01/02/2016
- Nº Volúmenes: 1
- Idioma: Inglés