Advances in Imaging and Electron Physics merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Contains contributions from leading authorities on the subject matterInforms and updates with all the latest developments in the field of imaging and electron physicsProvides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electron, and ion emission with a valuable resourceFeatures extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing INDICE: Quantum Entanglement in Photon-Induced Electron Spectroscopy of Atoms and Molecules: Its Generation, Characterization, and Applications N. Chandra and S. Parida Voltage Contrast Modes in a Scanning Electron Microscope and their Application V.G. Dyukov, S.A. Nepijko and G. Schönhense A Review of Scanning Electron Microscopy in Near Field Emission Mode T. L. Kirk
- ISBN: 978-0-12-804812-2
- Editorial: Academic Press
- Encuadernacion: Cartoné
- Páginas: 232
- Fecha Publicación: 01/09/2016
- Nº Volúmenes: 1
- Idioma: Inglés