This book will cover the fundamentals, experimental methods and applications of two-dimensional x-ray diffraction, including geometry convention, x-ray source and optics, two-dimensional detectors, diffraction data interpretation, and configurations for various applications, such as phase identification, texture, stress, microstructure analysis, crystallinity, thin film analysis and combinatorial screening. Experimental examples in materials research, pharmaceuticals, and forensics are also given.
- ISBN: 978-0-470-22722-0
- Editorial: John Wiley & Sons
- Encuadernacion: Cartoné
- Páginas: 440
- Fecha Publicación: 28/08/2009
- Nº Volúmenes: 1
- Idioma: Inglés