Advances in Speckle metrology and related techniques

Advances in Speckle metrology and related techniques

Kaufmann, Guillermo

130,60 €(IVA inc.)

INDICE: 1. Radial Speckle Interferometry and Applications 2. Depth-ResolvedDisplacement Field Measurement 3. Single-Image Interferogram Demodulation 4. Phase Evaluation in Temporal Speckle Pattern Interferometry using Time-Frequency Methods 5. Optical Vortex Metrology 6. Speckle Coding for Optical and Digital Data Security Applications

  • ISBN: 978-3-527-40957-0
  • Editorial: Wiley-VCH
  • Encuadernacion: Cartoné
  • Páginas: 340
  • Fecha Publicación: 16/03/2011
  • Nº Volúmenes: 1
  • Idioma: Inglés