X-Ray Diffraction for Materials Research: From Fundamentals to Applications

X-Ray Diffraction for Materials Research: From Fundamentals to Applications

Lee, Myeongkyu

143,52 €(IVA inc.)

This informative new book describes the principles of X-ray diffraction and its applications to materials characterization. It consists of three parts. The first deals with elementary crystallography and optics, which is essential for understanding the theory of X-ray diffraction discussed in the second section of the book. Part 2 describes how the X-ray diffraction can be applied for characterizing such various forms of materials as thin films, single crystals, and powders. The third section of the book covers applications of X-ray diffraction.

  • ISBN: 9781771882989
  • Editorial: Apple Academic Press, Inc.
  • Encuadernacion: Tela
  • Páginas: 302
  • Fecha Publicación: 04/02/2016
  • Nº Volúmenes: 1
  • Idioma: