Atom Probe Tomography

Atom Probe Tomography

Lefebvre, Williams
Vurpillot, Francois
Sauvage, Xavier

125,84 €(IVA inc.)

Atom Probe Tomography is aimed at beginners and researchers interested in expanding their expertise. It provides the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques, and includes detailed explanations of the fundamentals, the instrumentation, contemporary specimen preparation techniques, and experimental details, as well as an overview of the results that can be obtained. The book emphasizes processes for assessing data quality and the proper implementation of advanced data mining algorithms. For those more experienced in the technique, this book will serve as a single comprehensive source of indispensable reference information, tables, and techniques. Both beginner and expert will value the way the book is set out in the context of materials science and engineering. In addition, its references to key research outcomes based upon the training program held at the University of Rouen, the institution which developed the process of atom probe tomography and which remains one of the leading scientific research centers exploring the various aspects of the instrument, will further enhance understanding and the learning process. Provides an introduction to the capabilities and limitations of atom probe tomography when analyzing materialsWritten for both experienced researchers and new usersIncludes exercises, along with corrections, for users to practice the techniques discussedContains coverage of more advanced and less widespread techniques, such as correlative APT and STEM microscopy INDICE: Introduction Chapter 1. Atom Probe Fundamentals Chapter 2. Field Ion Emission Mechanisms  Chapter 3. Field Ion Microscopy Chapter 4. Specimen Preparation by Focused Ion Beam Chapter 5. Time of Flight Mass Spectrometry and Composition Measurements Chapter 6. Atom Probe Tomography Detectors Chapter 7. 3D Reconstructions Chapter 8. Laser Assisted Field Evaporation Chapter 9. Data Mining Chapter 10. Correlative Microscopy by APT and (S)TEM Chapter 11. Combining APT and Spectroscopy Conclusion Appendix Index

  • ISBN: 978-0-12-804647-0
  • Editorial: Academic Press
  • Encuadernacion: Cartoné
  • Páginas: 370
  • Fecha Publicación: 01/06/2016
  • Nº Volúmenes: 1
  • Idioma: Inglés