Monatomic Two-Dimensional Layers: Properties, Fabrication and Industrial Applications

Monatomic Two-Dimensional Layers: Properties, Fabrication and Industrial Applications

Matsuda, Iwao

182,00 €(IVA inc.)

Monatomic Two-Dimensional Layers provides a detailed examination on basic principles and state-of-the-art experimental techniques for monatomic layers on model surfaces or in operating devices. Both conventional surface science and novel 2D material science are included and the reader is guided through an introduction to the basic science of the field before covering the advanced science specific to the system. Characterization techniques are discussed next, and the final chapters examine the principles of state-of-the-art instruments for monatomic layers. Throughout the volume, the authors describe modern experimental approaches and techniques that have not been covered in previous books, including positron diffraction, time-resolved photoemission spectroscopy, surface transport measurements, and operando nanospectroscopy. Researchers, graduate students and professionals will find this volume invaluable to approach the field or to acquire a deeper knowledge of the basic science, preparation, and experimental characterization techniques for 2D materials. Industrial technicians and operators will find it a useful overview of surface science related methods for fabrication and characterization of 2D materials. Gives comprehensive access to the properties of 2D materials, selected fabrication methods, and advanced characterization toolsDiscusses structure analysis by diffraction methods, and 'operando' spectroscopy to provide direct information on device performance for industrial applicationsWritten by authors who developed the techniques and have conducted extensive research on monatomic layers INDICE: Basics 1. Single-layer 2D materials: basics, fabrications, and characterizations 2. Surface Science: single atomic layers on crystal surfaces 3. Interplay of two different 2D lattices Modern Measurement techniques 4. Diffraction: Determination of atomic structure 5. Spectroscopy: Mapping of electronic structure to tracking carriers 6. Transport Measurement: Carrier transport 7. Operando Measurement and the Industrial Use

  • ISBN: 978-0-12-814160-1
  • Editorial: Elsevier
  • Encuadernacion: Rústica
  • Páginas: 400
  • Fecha Publicación: 01/08/2018
  • Nº Volúmenes: 1
  • Idioma: Inglés