Noncontact atomic force microscopy v. 2

Since the original publication of Noncontact Atomic Force Microscopy in 2002,the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent resultsobtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution; tuning fork; atomic manipulation; magnetic exchange force microscopy; atomic and molecular imaging in liquids; and other new technologies. These results and technologies are now helping evolve NC-AFM toward practical tools for characterization and manipulation of individual atoms/moleculesand nanostructures with atomic/subatomic resolution. Therefore, the book exemplifies how NC-AFM has become a crucial tool for the expanding fields of nanoscience and nanotechnology. INDICE: Introduction.- Method for Precise Force Measurements.- Force Spectroscopy on Semiconductors.- Tip-sample Interactions as a Function of Distance on Insulating Surfaces.- Imaging and Force Spectroscopy on Layered Materials.-Principles and Applications of the qPlus Sensor.- Atomic Resolution Imaging and Site-Specific Spectroscopy on Model Catalyst.- Atom Manipulation on Semiconductor Surfaces.- Atomic Manipulation on Metal Surfaces.- Atom Manipulation onInsulator Surfaces.- Simulations on Atomic Manipulation on Semiconductor Surfaces.- Multi-Scale Modeling of NC-AFM Imaging and Controlling Atomic Dynamics at Insulating Surfaces.- Magnetic Exchange Force Microscopy.- Frequency Modulation Atomic Force Microscopy in Liquids.- Biological Applications of FM-AFM for Liquid Environment.- Low Amplitude High-Frequency Imaging with Deflection and Torsion of the Cantilever in Vacuum and Liquid.- Cantilever Dynamics and Nonlinear Effects in Atomic Force Microscopy.-

• ISBN: 978-3-642-01494-9
• Editorial: Springer
• Encuadernacion: Cartoné
• Páginas: 361
• Fecha Publicación: 12/08/2009
• Nº Volúmenes: 1
• Idioma: Inglés