This book introduces the basic concepts necessary to understand Single Event phenomena which could cause random performance errors and catastrophic failures to electronics devices. As miniaturization of electronics components advances, electronics components are more susceptible in the radiation environment. The book includes a discussion of the radiation environments in space and in the atmosphere, radiation rate prediction depending on the orbit to allow electronics engineers to design and select radiation tolerant components and systems, and single event prediction. INDICE: 1. Introduction. 2. Foundation of Single Event Analysis and Prediction. 3. Optimizing Heavy Ion Experiments for Analysis. 4. Optimizing Proton Testing. 5. Data Qualification and Interpretation. 6. Analysis of various typesof SEU data. 7. Cosmic Ray Single Event Rate Calculations. 8. Proton Single Event Rate Calculations. 9. Neutron induced upset. 10. Upsets produced by heavyion nuclear reactions. 11. Samples of Heavy Ion Rate Prediction. 12. Samples of Proton rate predictions. 13. Combined Environments. 14. Samples of Solar events and extreme situations. 15. Upset Rates in Neutral Particle Beam (NPB) environments. 16. Predictions and Observations of SEU Rates in Space. 17. Limitations of the IRPP approach. 18. Appendices. 19. References.
- ISBN: 978-0-470-76749-8
- Editorial: John Wiley & Sons
- Encuadernacion: Cartoné
- Páginas: 448
- Fecha Publicación: 05/08/2011
- Nº Volúmenes: 1
- Idioma: Inglés