(4 resultados)
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114,39€(IVA inc.)
Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
- Bosio, Alberto
- 978-1-4899-8314-5
- 2014-09-03
103,95€(IVA inc.)
Advanced test methods for SRAMs: effective solutions for dynamic fault detection in nanoscaled technologies
- Bosio, Alberto
- 978-1-4419-0937-4
- 2009-11-01
135,15€(IVA inc.)
Power-aware testing and test strategies for low power devices
- Girard, Patrick
- 978-1-4419-0927-5
- 2009-11-01
155,99€(IVA inc.)
Power-Aware Testing and Test Strategies for Low Power Devices
- Girard, Patrick
- 978-1-4899-8313-8
- 2014-09-05