Structural, Syntactic, and Statistical Pattern Recognition

Structural, Syntactic, and Statistical Pattern Recognition

Robles-Kelly, Antonio
Loog, Marco
Biggio, Battista
Escolano Ruiz, Francisco
Wilson, Richard

76,96 €(IVA inc.)

This book constitutes the proceedings of the Joint IAPR International Workshop on Structural Syntactic, and Statistical Pattern Recognition, S+SSPR 2016, consisting of the International Workshop on Structural and Syntactic Pattern Recognition SSPR, and the International Workshop on Statistical Techniques in Pattern Recognition, SPR. The 51 full papers presented were carefully reviewed and selected from 68 submissions. They are organized in the following topical sections: dimensionality reduction, manifold learning and embedding methods; dissimilarity representations; graph-theoretic methods; model selection, classification and clustering; semi and fully supervised learning methods; shape analysis; spatio-temporal pattern recognition; structural matching; text and document analysis. 

  • ISBN: 978-3-319-49054-0
  • Editorial: Springer
  • Encuadernacion: Rústica
  • Páginas: 586
  • Fecha Publicación: 04/12/2016
  • Nº Volúmenes: 1
  • Idioma: Inglés