This completely revised successor to the Handbook of Microscopy supplies in-depth coverage of all imaging technologies from the optical to the electron andscanning techniques. Adopting a twofold approach, the book firstly presents the various technologies as such, before going on to cover the materials class by class, analyzing how the different imaging methods can be successfully applied. It covers the latest developments in techniques, such as in-situ TEM, 3D imaging in TEM and SEM, as well as a broad range of material types, including metals, alloys, ceramics, polymers, semiconductors, minerals, quasicrystals, amorphous solids, among others. The volumes are equally divided between methodsand applications, making this both a reliable reference and handbook for chemists, physicists, biologists, materials scientists and engineers, as well as graduate students and their lecturers. INDICE: I. METHODS VOL. 1 General Introduction From the Past to the Future1. Light Microscopy Fundamentals of Light Microscopy and Optical Contrasting of Microstructures Raman and Infrared Spectroscopy 3D Imaging Near Field Optical Microscopy 2. X-ray Microscopy Soft X-ray Imaging X-ray Microtomography X-ray and Neutron Diffraction Topography 3. Acoustic Microscopy Scanning AcousticMicroscopy Photoacoustic Microscopy Electron Acoustic Microscopy Scanning Laser Acoustic Microscopy 4. Electron Microscopy: Stationary Beam Methods Transmission Electron Microscopy High-resolution Electron Microscopy Reflection Electron Microscopy Electron Energy-loss Spectroscopy Imaging Low-energy Electron Microscopy Lorentz Microscopy Electron Holography Methods In-situ Electron Microscopy 3D Imaging in TEM, SEM 5. Scanning Beam Methods Scanning Electron Microscopy Scanning Transmission Electron Microscopy: Z Contrast Composition Mapping Imaging Secondary Ion Mass Spectroscopy VOL. 2 6. Magnetic Methods NMR Imaging SEM with Polarization Analysis Spin-polarized Low-energy Electron Microscopy 7. Emission Methods Photoelectron Emission Microscopy Field Emission and Field Ion Microscopy 8. Scanning Point Probe Techniques General Introduction Scanning Tunneling Microscopy Scanning Force Microscopy Magnetic Force Microscopy Ballistic Electron Emission Microscopy 9. Image Recording, Handling and Processing Image Recording in Microscopy Image Processing 10. Special Topics Lenseless Imaging Nanolaboratory II. APPLICATIONS VOL. 3 CLASSES OF MATERIALS Metals and Alloys Rocks and Minerals Semiconductors and Semiconducting Devices Optoelectronic/Spintronic materials Ferroic Materials Structural Ceramics Perovskite-based Materials Non-periodic Structures and Amorphous Materials Quasi-crystalline Structures VOL. 4 CLASSES OF MATERIALS (continued) Biomaterials Carbon Composite Structural Materials Structure of Polymers and their Monomeric AnalogsMagnetic Materials Small Particles Preparation Techniques for TEM Catalytic Materials and Porous Materials Nanostructured Materials SPECIAL TOPICS Phase Transformations Specimen Preparation Techniques Environmental Problems Thin FilmGrowth Quantitative Hyleography
- ISBN: 978-3-527-31706-6
- Editorial: Wiley-VCH
- Encuadernacion: Cartoné
- Páginas: 1344
- Fecha Publicación: 11/01/2012
- Nº Volúmenes: 2
- Idioma: Inglés