(4 resultados)
Ordenar por
ordenar por...
72,79€(IVA inc.)
Defects and Impurities in Silicon Materials
- Yoshida, Yutaka
- 978-4-431-55799-9
- 2015-12-22
310,96€(IVA inc.)
ICAME 2011: Proceedings of the 31st International Conference on the Applications of the Mössbauer Effect (ICAME 2011) held in Tokyo, Japan, 25-30 September 2011
- Yoshida, Yutaka
- 978-94-007-4761-6
- 2012-07-01