(6 resultados)

30,05€(IVA inc.)

Applied Materials Characterization: Volume 48
  • Katz, W.
  • 978-1-107-40569-1
  • 2014-06-05
125,84€(IVA inc.)

Atom Probe Tomography
  • Lefebvre, Williams
  • 978-0-12-804647-0
  • 2016-06-01
30,65€(IVA inc.)

Beam-Solid Interactions and Transient Processes: Volume 74
  • Thompson, Michael O.
  • 978-1-107-41118-0
  • 2014-06-05
30,65€(IVA inc.)

Chemistry and Defects in Semiconductor Heterostructures: Volume 148
  • Kawabe, Mitsuo
  • 978-1-107-41043-5
  • 2014-06-05
0,00€(IVA inc.)

Transmission electron microscopy: a textbook for materials science
  • Williams, David B.
  • 978-0-387-76502-0
  • 2009-01-01
114,39€(IVA inc.)

Transmission Electron Microscopy
  • Carter, C. Barry
  • 978-3-319-26649-7
  • 2016-04-08