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239,20€(IVA inc.)
Microscopy of semiconducting materials 2007: Proceedings of the 15th Conference, 2-5 April 2007, Cambridge, UK
- Cullis, A.
- 978-1-4020-8614-4
- 2008-09-01
362,96€(IVA inc.)
Springer handbook of metrology and testing
- Czichos, Horst
- 978-3-642-16640-2
- 2011-06-01
58,24€(IVA inc.)
Power electronics and instrumentation engineering: International Conference, PEIE 2010,Kochi, Kerala, India, September 7-9, 2010, Proceedings
- Das, Vinu V.
- 978-3-642-15738-7
- 2010-09-02
58,24€(IVA inc.)
Advances in power electronics and instrumentationengineering: Second International Conference, PEIE 2011, Nagpur, Maharashtra, India, April 21-22, 2011. Proceedings
- Das, Vinu V.
- 978-3-642-20498-2
- 2011-04-13
176,75€(IVA inc.)
Remote instrumentation services on the eInfrastructure: applications and tools
- Davoli, Franco
- 978-1-4419-5573-9
- 2010-06-29
169,79€(IVA inc.)
In-situ electron microscopy: applications in physics, chemistry and materials science
- Dehm, Gerhard
- 978-3-527-31973-2
- 2012-04-25
114,28€(IVA inc.)
Monitoring and control of information-poor systems: an approach based on fuzzy relational models
- Dexter, Arthur L.
- 978-0-470-68869-4
- 2012-04-13
393,82€(IVA inc.)
Handbook of optical systems: metrology of optical components and systems
- Dörband, Bernd
- 978-3-527-40381-3
- 2012-04-04